möglich sobald bei der ZB eingereicht worden ist.
Fast and analytical exact reconstruction of large CT-volumes.
In: Proceedings (18th World Conference on Nondestructive Testing, 16-20 April 2012, Durban, South Africa). South Africa: South African Institute for Non-Destructive Testing (SAINT), 2012. 150-159 (Proceedings of the WCND ; 18)
Computed Tomography (CT) has become very important for industrial applications. The fields of application are ranging from highly specialized tasks in CT inline inspection to universal X-ray systems, metrology and highresolution CT, for example in microelectronics. For high-energy scans of high quality fan-beam CT using linear detector arrays (LDA) is the right choice due to the bigger field of view and the superior collimation reducing scatter artefacts compared to flat panel detectors, which are used for cone-beam CT. The conventional filtered back projection (FBP) as reconstruction algorithm requires equally spaced X-rays, i.e. it was designed for parallel beam geometry. Its computational effort depends mainly on the size of the reconstructed volume. In this article we will introduce a fast and analytical exact reconstruction algorithm, based on the orthogonal polynomial expansion on the disk (OPED). Its numerical complexity only depends on the amount of the input data (projections). OPED is designed to overcome aliasing artefacts and streaks. It needs no special filtering, i.e. it can be easily parameterized. The alignment of the sample grid is very well suited for fan beam geometry with its non-equally spaced X-rays. As result, we will compare the performance of the OPED and FBP algorithm.
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Publikationstyp Artikel: Konferenzbeitrag
Schlagwörter Computed Tomography (CT); Line Detector Array (LDA); automotive, aerospace; Large CTVolumes; Orthogonal Polynomial Expansion on the Disk (OPED); Filtered Back Projection (FBP)
Konferenztitel 18th World Conference on Nondestructive Testing, 16-20 April 2012, Durban, South Africa
Quellenangaben Band: 18, Seiten: 150-159
Reihe Proceedings of the WCND
Verlag South African Institute for Non-Destructive Testing (SAINT)
Verlagsort South Africa