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Determination of relative ionization cross sections for resonance enhanced multiphoton ionization of polycyclic aromatic hydrocarbons.

Appl. Sci. 8:1617 (2018)
Verlagsversion DOI
Open Access Gold
Creative Commons Lizenzvertrag
Resonance enhanced multiphoton ionization (REMPI) is a powerful method for the sensitive determination of polycyclic aromatic hydrocarbons (PAHs) in gaseous mixtures via mass spectrometry (MS). In REMPI, ions are produced by the absorption of at least two photons including defined electronic intermediate states. As a resultunlike other laser-based ionization techniquesspectroscopic selectivity is involved into the ionization process. Nevertheless, these wavelength-dependent ionization rates impede the quantification using REMPI. For this purpose, relative photoionization cross sections (relPICS) give an easy-to-use approach to quantify REMPI-MS measurements. Hereby, the ionization behavior of a single compound was compared to that of a reference substance of a given concentration. In this study, relPICS of selected single-core aromatics and PAHs at wavelengths of 266 nm and 248 nm were determined using two different time-of-flight mass spectrometric systems (TOFMS). For PAHs, relPICS were obtained which showed a strong dependence on the applied laser intensity. In contrast, for single-core aromatics, constant values of relPICS were determined. Deviations of relPICS between both TOFMS systems were found for small aromatics (e.g., benzene), which can be assigned to the differences in UV generation in the particular system. However, the relPICS of this study were found to be in good agreement with previous results and can be used for system-independent quantification.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
Schlagwörter Rempi-tofms ; Quantification ; Cross Section ; Polycyclic Aromatic Hydrocarbons; Flight Mass-spectrometry; Multi-photon-ionization; Complex Gas-mixtures; Real-time Analysis; Polyatomic-molecules; Polyaromatic Hydrocarbons; 2-photon Ionization; Trace Analysis; Spectroscopy; Photoionization
ISSN (print) / ISBN 2076-3417
e-ISSN 2076-3417
Zeitschrift Applied Sciences
Quellenangaben Band: 8, Heft: 9, Seiten: , Artikelnummer: 1617 Supplement: ,
Verlag MDPI
Verlagsort Basel
Begutachtungsstatus Peer reviewed