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Woda, C. ; Greilich, S.* ; Beerten, K.*

On the OSL curve shape and preheat treatment of electronic components from portable electronic devices.

Radiat. Meas. 45, 746-748 (2010)
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The shape of the OSL decay curve and the effect of longer time delays between accidental exposure and readout of alumina-rich electronic components from portable electronic devices are investigated. The OSL decay curve follows a hyperbolic decay function, which is interpreted as an approximation of several closely spaced or even a continuous distribution of single trap OSL decay functions. Longer time delays between exposure and readout lead to a rising dose vs. OSL integration time plot, when applying a low preheat. Supplementary TL investigations indicate a distribution in activation energies for the main dosimetric (190 degrees C) peak and that the lower temperature part could fade with a higher rate than the higher temperature part. Consequences for the applied preheat treatment prior to dose measurement are discussed.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
Schlagwörter Accident dosimetry; Retrospective dosimetry; Portable electronic devices; Emergency dosimeter; Optically stimulated luminescence; Thermoluminescence
ISSN (print) / ISBN 1350-4487
e-ISSN 1879-0925
Quellenangaben Band: 45, Heft: 3-6, Seiten: 746-748 Artikelnummer: , Supplement: ,
Verlag Elsevier
Begutachtungsstatus Peer reviewed