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Robert, H.L.* ; Diederichs, B. ; Muller-Caspary, K.*

Contribution of multiple plasmon scattering in low-angle electron diffraction investigated by energy-filtered atomically resolved 4D-STEM.

Appl. Phys. Lett. 121:213502 (2022)
Verlagsversion DOI
Open Access Gold (Paid Option)
Creative Commons Lizenzvertrag
We report the influence of multiple plasmon losses on the dynamical diffraction of high-energy electrons, in a scanning transmission electron microscopy (STEM) study. Using an experimental setup enabling energy-filtered momentum-resolved STEM, it is shown that the successive excitation of up to five plasmons within the imaged material results in a subsequent and significant redistribution of low-angle intensity in diffraction space. An empirical approach, based on the convolution with a Lorentzian kernel, is shown to reliably model this redistribution in dependence of the energy-loss. Our study demonstrates that both the significant impact of inelastic scattering in low-angle diffraction at elevated specimen thickness and a rather straightforward model can be applied to mimic multiple plasmon scattering, which otherwise is currently not within reach for multislice simulations due to computational complexity.
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Publikationstyp Artikel: Journalartikel
Dokumenttyp Wissenschaftlicher Artikel
ISSN (print) / ISBN 0003-6951
e-ISSN 1077-3118
Quellenangaben Band: 121, Heft: 21, Seiten: , Artikelnummer: 213502 Supplement: ,
Verlag American Institute of Physics (AIP)
Begutachtungsstatus Peer reviewed
Institut(e) Institute of Biological and Medical Imaging (IBMI)
Helmholtz AI - FZJ (HAI - FZJ)
Förderungen Helmholtz Association
Deutsche Forschungsgemeinschaft